In order to study the preferred crystal orientations of Mg-Zr-O composite
protective layers in PDP, Mg-Zr-O composite protective layers were deposited
by Electron-beam Evaporator using (MgO+ZrO2) powder mixture as
evaporation source material. X-ray diffractometer (XRD) was used to
determine preferred crystal orientations of Mg-Zr-O composite protective
layers, surface morphologies of films were analyzed by FESEM and voltage
characteristics were examined in a testing macroscopic discharge cell of
AC-PDP. On the basis of experimental analysis, the influence of oxide
addition and deposition conditions on preferred orientations of Mg-Zr-O
composite protective layers were investigated. The results showed that the
preferred orientations of Mg-Zr-O films were determined by lattice
distortion of MgO crystal. The deposition conditions have great effects on
the preferred orientations of Mg-Zr-O films. The preferred orientations
affect voltage characteristics through affecting surface morphology of
Mg-Zr-O films. A small amount of Zr solution in MgO can decrease firing
voltage compared with using pure MgO film. Firing voltage is closely related
with the [ ZrO2/(MgO+ZrO2)] ratio of evaporation source materials.